OOPS! (OntOlogy Pitfall Scanner!)

OOPS! is an ontology evaluation tool developed by the Ontology Engineering Group (OEG) at the Polytechnic University of Madrid, Spain (UPM, ES) that helps a developer detect some of the most common pitfalls appearing when developing ontologies.

Home page: http://www.oeg-upm.net/oops

Information about RESTFul Web Service: http://oops-ws.oeg-upm.net/

Reference:

• http://2012.eswc-conferences.org/sites/default/files/eswc2012_submission_322.pdf
• presentation by Ms. MariaPovedaVillalon (Universidad Politécnica de Madrid), Dr. MariCarmenSuarezFigueroa (Universidad Politécnica de Madrid) and Dr. AsuncionGomezPerez (Universidad Politécnica de Madrid) - "A Pitfall Catalogue and OOPS!: An Approach to Ontology Validation" - given at the Ontology Summit 2013 on 2013.01.31 - http://ontolog.cim3.net/cgi-bin/wiki.pl?ConferenceCall_2013_01_31#nid3L73